Personal Information

Cheng Deruo, Ph.D.

Research Scientist

Nanyang Technological University (NTU), Singapore

Temasek Laboratories (TL) @ NTU

Email: deruo.cheng@ntu.edu.sg

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Biography

I am a Postdoctoral Research Scientist working on hardware security and machine learning.

Education Experience

Work Experience

Publications

1. Lu Zhang, Hari Kang, Jaekwon Lee, Deruo Cheng, Donghyun Kim, and Kar-Ann Toh. "MKFi: Multi-Window Kernel for Few-Shot WiFi CSI-Based Human Activity Recognition with Temporal Robustness." Pattern Recognition, 2025.
2. Xinrui Wang, Deruo Cheng, Yiqiong Shi, and Bah-Hwee Gwee. "Multi-Orientation OCR Pipeline for IC Printed Mark Recognition." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2025.
3. Deruo Cheng, Yee-Yang Tee, Xuenong Hong, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Unsupervised Domain Adaptation for IC Image Segmentation with Structural Constraint and Pseudo Supervision." Microelectronic Engineering, 2025.
4. Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Integrated Circuit Image Synthesis for Unsupervised Circuit Annotation via Shape Consistent Image Translation." IEEE Intelligent Systems, 2025.
5. Yuhang Wang, Xinrui Wang, Deruo Cheng, Tong Lin, Feng Ji, Yiqiong Shi, and Bah-Hwee Gwee. "SSRNet: Few-shot IC Segmentation in Automated PCB Image Processing." In IEEE International Symposium on Circuits and Systems (ISCAS), 2025.
6. Heyi Zhang, Tong Lin, Feng Ji, Deruo Cheng, Yiqiong Shi, and Bah Hwee Gwee. "Long-Short-GNN: a Novel Graph Neural Network for Detecting FPGA IP Circuits for Hardware Assurance." In IEEE International Symposium on Circuits and Systems (ISCAS), 2025.
7. Xiaoyu Ma, Yizhen Li, Feng Ji, Tong Lin, Yiqiong Shi, Deruo Cheng, and Bah Hwee Gwee. "Multiple Hypothesis Testing for SEM Image Processing: A Case Study on Standard Cell Partition." In IEEE International Symposium on Circuits and Systems (ISCAS), 2025.
8. Hong Duc Nguyen, Deruo Cheng, Xinrui Wang, Yiqiong Shi, and Bihan Wen. "Data-Efficient Deep Learning for Printed Circuit Board Defect Detection Using X-ray Images." IEEE Transactions on Instrumentation & Measurement, 2025.
9. Yong Jian Ng, Yee-Yang Tee, Deruo Cheng, and Bah-Hwee Gwee. "SAMIC: Segment Anything Model for Integrated Circuit Image Analysis." In IEEE Region 10 Conference (TENCON), 2024.
10. Xuenong Hong, Yee-Yang Tee, Zilong Hu, Tong Lin, Yiqiong Shi, Deruo Cheng, and Bah-Hwee Gwee. "GNNReveal: A Novel Graph Neural Network-based Attack Method for IC Logic Gate De-Camouflaging." IEEE Intelligent Systems, 2024.
11. Luyun Li, Deruo Cheng, Yiqiong Shi, and Bah-Hwee Gwee. "Unpaired Synthesis of IC Scanning Electron Microscopy Images with Structural Constraints." In IEEE International Conference on Imaging Systems and Techniques (IST), 2024.
12. Deruo Cheng, Jingyang Dai, Yee-Yang Tee, Yiqiong Shi, and Bah-Hwee Gwee. "PCB Surface Component Detection with Computer Vision Assisted Label Generation." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024.
13. Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Unsupervised Domain Adaptation with Pseudo Shape Supervision for IC Image Segmentation." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024.
14. Xuenong Hong, Zilong Hu, Han Zhang, Yee-Yang Tee, Tong Lin, Yiqiong Shi, Deruo Cheng, and Bah-Hwee Gwee. "MLConnect: A Machine Learning Based Connection Prediction Framework for Error Correction in Recovered Circuit." In IEEE International Symposium on Circuits and Systems (ISCAS), 2024.
15. Yee-Yang Tee, Chye-Soon Chee, Deruo Cheng, Xuenong Hong, Yiqiong Shi, and Bah-Hwee Gwee. "A Strategic Framework for Evaluating Data Augmentation in Microscopic IC Image Analysis." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023.
16. Xuenong Hong, Yee-Yang Tee, Tong Lin, Yiqiong Shi, Deruo Cheng, Erdong Huang, and Bah-Hwee Gwee. "GoCLIP: Graph one-class CLassification for Intellectual Property Circuit Identification." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023.
17. Deruo Cheng, Yiqiong Shi, Yee-Yang Tee, Jingsi Song. Xue Wang, Bihan Wen, and Bah-Hwee Gwee. "Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards." In IEEE International Conference on Artificial Intelligence Circuits & Systems (AICAS), 2023.
18. Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Unsupervised Graph-Based Image Clustering For Pretext Distribution Learning In IC Assurance." Microelectronics Reliability, 2023.
19. Yee-Yang Tee, Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee. "Integrated Circuit Mask-GAN for Circuit Annotation with Targeted Data Augmentation." IEEE Intelligent Systems, 2023.
20. Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Chye-Soon Chee, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee. "Patch-based Adversarial Training for Error-aware Circuit Annotation of Delayered IC Images." IEEE Transactions on Circuits and Systems II: Express Briefs, 2023.
21. Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee. "Domain-Integrated Machine Learning for IC Image Analysis." Fusion of Machine Learning Paradigms: Theory and Applications, Springer International Publishing, 2023.
22. Yee-Yang Tee, Deruo Cheng, Chye-Soon Chee, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis." In IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022.
23. Deruo Cheng, Yee-Yang Tee, Jingsi Song, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee. "Semantic-Masked Intensity Augmentation for Deep Learning-based Analysis of FPGA Images." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2022.
24. Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee. "Hybrid Unsupervised Clustering for Pretext Distribution Learning in IC Image Analysis." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2022.
25. Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, and Kar-Ann Toh. "Delayered IC Image Analysis with Template-based Tanimoto Convolution and Morphological Decision." IET Circuits, Devices & Systems, 2022.
26. Huang Ling, Deruo Cheng, Xulei Yang, Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah-Hwee Gwee, and Bihan Wen. "Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning." In IEEE International Conference on Image Processing (ICIP), 2021.
27. Tong Lin, Yiqiong Shi, Na Shu, Deruo Cheng, Xuenong Hong, Jingsi Song, and Bah-Hwee Gwee. "Deep Learning-Based Image Analysis Framework for Hardware Assurance of Digital Integrated Circuits." Microelectronics Reliability, 2021.
28. Tong Lin, Yiqiong Shi, Na Shu, Deruo Cheng, Xuenong Hong, Jingsi Song, and Bah-Hwee Gwee. "Deep Learning-Based Image Analysis Framework for Hardware Assurance of Digital Integrated Circuits." In IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2020.
29. Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, and Kar-Ann Toh. "Global Template Projection and Matching Method for Training-Free Analysis of Delayered IC Images." In IEEE International Symposium on Circuits and Systems (ISCAS), 2019.
30. Xuenong Hong, Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee. "Deep Learning for Automatic IC Image Analysis." In IEEE International Conference on Digital Signal Processing (DSP), 2018.
31. Deruo Cheng, Yiqiong Shi, Bah-Hwee Gwee, Kar-Ann Toh, and Tong Lin. "A Hierarchical Multi-Classifier System for Automated Analysis of Delayered IC Images." IEEE Intelligent Systems, 2018.
32. Deruo Cheng, Yiqiong Shi, Bah-Hwee Gwee, and Kar-Ann Toh. "Hybrid K-Means Clustering and Support Vector Machine Method for Via and Metal Line Detections in Delayered IC Images." IEEE Transactions on Circuits and Systems II: Express Briefs, 2018.

Academic Experience