Publication

2024

  1. GNNReveal: A Novel Graph Neural Network-based Attack Method for IC Logic Gate De-Camouflaging
    Xuenong Hong, Yee-Yang Tee, Zilong Hu, Tong Lin, Yiqiong Shi, Deruo Cheng, and Bah-Hwee Gwee
    IEEE Intelligent Systems, 2024
  2. PCB Surface Component Detection with Computer Vision Assisted Label Generation
    Deruo Cheng, Jingyang Dai, Yee-Yang Tee, Yiqiong Shi, and Bah-Hwee Gwee
    In 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024
  3. Unsupervised Domain Adaptation with Pseudo Shape Supervision for IC Image Segmentation
    Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee
    In 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024
  4. MLConnect: A Machine Learning Based Connection Prediction Framework for Error Correction in Recovered Circuit
    Xuenong Hong, Zilong Hu, Han Zhang, Yee-Yang Tee, Tong Lin, Yiqiong Shi, Deruo Cheng, and Bah-Hwee Gwee
    In 2024 IEEE International Symposium on Circuits and Systems (ISCAS), 2024

2023

  1. Unsupervised graph-based image clustering for pretext distribution learning in IC assurance
    Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee
    Microelectronics Reliability, 2023
  2. Integrated Circuit Mask-GAN for Circuit Annotation with Targeted Data Augmentation
    Yee-Yang Tee, Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee
    IEEE Intelligent Systems, 2023
  3. A Strategic Framework for Evaluating Data Augmentation in Microscopic IC Image Analysis
    Yee-Yang Tee, Chye-Soon Chee, Deruo Cheng, Xuenong Hong, Yiqiong Shi, and Bah-Hwee Gwee
    In 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023
  4. GoCLIP: Graph one-class CLassification for Intellectual Property Circuit Identification
    Xuenong Hong, Yee-Yang Tee, Tong Lin, Yiqiong Shi, Deruo Cheng, Erdong Huang, and Bah-Hwee Gwee
    In 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023
  5. Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards
    Deruo Cheng, Yiqiong Shi, Yee-Yang Tee, Jingsi Song, Xue Wang, Bihan Wen, and Bah-Hwee Gwee
    In 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS), 2023
  6. Patch-based Adversarial Training for Error-aware Circuit Annotation of Delayered IC Images
    Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Chye-Soon Chee, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee
    IEEE Transactions on Circuits and Systems II: Express Briefs, 2023
  7. Domain-Integrated Machine Learning for IC Image Analysis
    Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee
    In Fusion of Machine Learning Paradigms: Theory and Applications, 2023

2022

  1. Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis
    Yee-Yang Tee, Deruo Cheng, Chye-Soon Chee, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee
    In 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022
  2. Semantic-Masked Intensity Augmentation for Deep Learning-based Analysis of FPGA Images
    Deruo Cheng, Yee-Yang Tee, Jingsi Song, Yiqiong Shi, Tong Lin, and Bah-Hwee Gwee
    In 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2022
  3. Hybrid Unsupervised Clustering for Pretext Distribution Learning in IC Image Analysis
    Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Tong Lin, Yiqiong Shi, and Bah-Hwee Gwee
    In 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2022
  4. Delayered IC image analysis with template-based Tanimoto Convolution and Morphological Decision
    Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, and Kar-Ann Toh
    IET Circuits, Devices & Systems, 2022

2021

  1. Joint anomaly detection and inpainting for microscopy images via deep self-supervised learning
    Ling Huang, Deruo Cheng, Xulei Yang, Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah Hwee Gwee, and Bihan Wen
    In 2021 IEEE International Conference on Image Processing (ICIP), 2021
  2. Deep learning-based image analysis framework for hardware assurance of digital integrated circuits
    Tong Lin, Yiqiong Shi, Na Shu, Deruo Cheng, Xuenong Hong, Jingsi Song, and Bah Hwee Gwee
    Microelectronics Reliability, 2021

2020

  1. Deep Learning-Based Image Analysis Framework for Hardware Assurance of Digital Integrated Circuits
    Tong Lin, Yiqiong Shi, Na Shu, Deruo Cheng, Xuenong Hong, Jingsi Song, and Bah Hwee Gwee
    In 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2020

2019

  1. Global template projection and matching method for training-free analysis of delayered IC images
    Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, and Kar-Ann Toh
    In 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 2019

2018

  1. A hierarchical multiclassifier system for automated analysis of delayered IC images
    Deruo Cheng, Yiqiong Shi, Bah-Hwee Gwee, Kar-Ann Toh, and Tong Lin
    IEEE Intelligent Systems, 2018
  2. Deep learning for automatic IC image analysis
    Xuenong Hong, Deruo Cheng, Yiqiong Shi, Tong Lin, and Bah Hwee Gwee
    In 2018 IEEE 23rd International Conference on Digital Signal Processing (DSP), 2018
  3. Hybrid ${K} $-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images
    Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, and Kar-Ann Toh
    IEEE Transactions on Circuits and Systems II: Express Briefs, 2018